Ecrin Yağız will defend her M.S. thesis entitled “Selection Field Induced Artifacts in Magnetic Particle Imaging and a Novel Framework for Nanoparticle Characterization” on October 9, 2020.
Ecrin Yağız will defend her M.S. thesis entitled “Selection Field Induced Artifacts in Magnetic Particle Imaging and a Novel Framework for Nanoparticle Characterization” on October 9, 2020.