Ecrin Yağız “Selection Field Induced Artifacts in Magnetic Particle Imaging and a Novel Framework for Nanoparticle Characterization” başlıklı yüksek lisans tezini 9 Ekim 2020 tarihinde savunacaktır.
Ecrin Yağız “Selection Field Induced Artifacts in Magnetic Particle Imaging and a Novel Framework for Nanoparticle Characterization” başlıklı yüksek lisans tezini 9 Ekim 2020 tarihinde savunacaktır.